Surface analysis

AFM A. Jung
Atomic Force Microscope (AFM)

For the analysis of sample surfaces mainly of thin film samples from PLD or CSD laboratories the following analysis is available:

  • Dimension Edge Atomic Force Microscope (Bruker), the X-Y scan range is 90x90 µm, the maximum z - deflection is 10 µm with a maximum error of 0.2 nm. The field of view of the camera covers 180 to 1465 µm, the focus is motorized.
  • Profilometer