Optical and scanning electron microscopy

Collage MetfieS. Kauffmann-Weiß

The samples prepared in the materialographic laboratory can be examined with the following light and electron microscopes:

  • Olympus BX53M digital reflected light microscope with magnifications of 50x, 100x and 500x. Available are brightfield, darkfield and differential interference contrast.
  • Digital microscope VHX-1000 (Keyence) with magnifications from 20x to 1000x. Available are brightfield, darkfield, differential interference contrast, motorized z-axis and free angle viewing.
  • Table-top SEM SH-5000P (Hirox) including EDX system Quantax (Bruker). The tungsten cathode SEM offers acceleration voltages 5, 10, 15, 20, 30 kV. In addition to the EDX detector, SE2 and BSE detectors are available.
  • Scanning electron microscope Apreo S LoVac (FEI) including an integrated EDX-EBSD system Pegasus (EDAX). The SEM has a Schottky field emission cathode, an SE2 detector, 3 different inline detectors and a retractable DBS detector for backscattered electrons.